Solid State Technology and Devices Seminar: Nanoscale imaging with RF sensors

Seminar | February 23 | 1-2 p.m. | Cory Hall, 521 Hogan Room

 Monica Allen, Stanford University

 Electrical Engineering and Computer Sciences (EECS)

Although the wavelength of microwaves far exceeds the nanoscale, it is possible to use an RF sensor to perform nanoscale imaging by confining electromagnetic fields to small spatial dimensions. In this talk, I will discuss microwave impedance microscopy (MIM), a near-field imaging tool that spatially visualizes the local conductivity and dielectric constant of a material with nanoscale precision. We have used MIM to image edge currents in topological insulators, a rapidly expanding class of semiconductor materials that exhibit novel transport behavior such as conductance quantization and suppressed backscattering. Finally, I will outline how MIM could be used in the future to image and manipulate topological Majorana modes, an emerging platform for quantum information processing.

 m.rivera@eecs.berkeley.edu, 510-642-3214